A high sensitivity process variation sensor utilizing sub-threshold operation

In this paper, we propose a novel low-power, bias-free, high-sensitivity process variation sensor for monitoring random variations in the threshold voltage. The proposed sensor design utilizes the exponential current-voltage relationship of sub-threshold operation thereby improving the sensitivity by 2.3X compared to the above-threshold operation. A test-chip containing 128 PMOS and 128 NMOS devices has been fabricated in 65 nm bulk CMOS process technology. A total of 28 dies across the wafer have been fully characterized to determine the random threshold voltage variations.

[1]  James Tschanz,et al.  Parameter variations and impact on circuits and microarchitecture , 2003, Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451).

[2]  S.D. Sudhoff,et al.  Evolutionary Design of Electromagnetic and Electromechanical Devices , 2007, 2007 IEEE Electric Ship Technologies Symposium.

[3]  Kaushik Roy,et al.  Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure , 2007, 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers.

[4]  S.D. Sudhoff,et al.  Analytical Design Model for Surface-Mounted Permanent-Magnet Synchronous Machines , 2009, IEEE Transactions on Energy Conversion.

[5]  Saibal Mukhopadhyay,et al.  Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits , 2003, Proc. IEEE.

[6]  Scott D. Sudhoff.  Waveform reconstruction from the average-value model of line-commutated converter-synchronous machine systems , 1993 .

[7]  M. Ketchen,et al.  Ring oscillator based technique for measuring variability statistics , 2006, 2006 IEEE International Conference on Microelectronic Test Structures.

[8]  S.D. Sudhoff,et al.  Genetic Algorithm Based Design of a Permanent Magnet Synchronous Machine , 2005, IEEE International Conference on Electric Machines and Drives, 2005..

[9]  Keith A. Jenkins,et al.  A Completely Digital On-Chip Circuit for Local-Random-Variability Measurement , 2008, 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers.

[10]  Joshua M Williams,et al.  Incorporating Motion in Mesh-Based Magnetic Equivalent Circuits , 2010, IEEE Transactions on Energy Conversion.

[11]  Keith A. Bowman,et al.  Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage , 2005, ISLPED '05. Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005..

[12]  Kaushik Roy,et al.  Self calibrating circuit design for variation tolerant VLSI systems , 2005, 11th IEEE International On-Line Testing Symposium.

[13]  Scott D. Sudhoff,et al.  Analysis of Electric Machinery and Drive Systems , 1995 .

[14]  William J. Bowhill,et al.  Design of High-Performance Microprocessor Circuits , 2001 .

[15]  J. Plusquellic,et al.  A test structure for characterizing local device mismatches , 2006, 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers..

[16]  Anantha Chandrakasan,et al.  A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays , 2007, 8th International Symposium on Quality Electronic Design (ISQED'07).

[17]  N. Azizi,et al.  Compensation for within-die variations in dynamic logic by using body-bias , 2005, The 3rd International IEEE-NEWCAS Conference, 2005..

[18]  Carlos Galup-Montoro,et al.  Characterization of MOS transistor current mismatch , 2004, Proceedings. SBCCI 2004. 17th Symposium on Integrated Circuits and Systems Design (IEEE Cat. No.04TH8784).

[19]  James D. Meindl,et al.  Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration , 2002, IEEE J. Solid State Circuits.

[20]  Vivek De,et al.  Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage , 2002, 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315).