Series-CouplingTestCharacterization ofOn-chip

On-chipsilicon-integrated and PWB-integrated transformers arecurrently being developed forsignal andpower applications in high-frequency powersupplies. Prototype transformers feature relatively highwinding resistances, coreloss, andleakage inductances compared toconventional transformers. Short-circuit tests havelimited useforcharacterizing these prototype high-parasitic transformers. In thispaper,series- coupling testsaredeveloped and applied fortheaccurate characterization oftheresistive andinductive elements ofon-chip silicon-integrated andPWB-integrated prototype transformers. Intheseries-coupling tests, thevarious resistive andinductive componentssimplysum togethermakingtransformer characterization moredirect androbustthanattempting to interpret theshort-circuit tests. Experimental results arevalidated byfinite-element simulation.