Oriented creation of anisotropic defects by IR femtosecond laser scanning in silica

Irradiation of non-luminescent silica with polarized IR femtosecond laser light produced a significant amount of luminescent defects. We have investigated the properties of luminescence produced by the defects using UV-VUV excitation experiment depending on the relative orientation of the laser polarization and its scanning direction. Silicon Oxygen Deficient Center (SiODC) is identified. SiODC related luminescence is much stronger when the excitation polarization is parallel to the sample scanning direction and moved at low velocity, regardless of the writing polarization direction. This indicates that the creation of this anisotropic defect is oriented by the movement of the femtosecond laser beam.

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