Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits

Abstract International standards have been proposed and used to test Integrated Circuits (ICs) for Total-Ionizing Dose (TID) and Single-Event Upset (SEU) as well as for Electromagnetic Interference (EMI). Nevertheless, these standards are separately applied to the IC or electronic system, one after the other, and do not take into account the combined effects of these types of radiation may take over the ICs. In more detail, there is no standard that rules combined tests for TID, SEU and EMI. This paper aims to fulfill this lack of product quality information and proposes a new methodology to improve the reliability of ICs by performing combined tests for TID, SEU and EMI. We also present recent experimental results from combined measurements that we performed on a commercial FPGA IC widely used in critical embedded applications such as aerospace and automotive. Such results strongly suggest that the effects of radiation are not negligible and should be taken into account if one intends to design reliable embedded systems.

[1]  Alexandre Boyer,et al.  Basis of Electromagnetic Compatibility of Integrated Circuits - A modeling approach using IC-EMC , 2017 .

[2]  P. Hazucha,et al.  Impact of CMOS technology scaling on the atmospheric neutron soft error rate , 2000 .

[3]  J. R. Srour,et al.  Radiation effects on microelectronics in space , 1988, Proc. IEEE.

[4]  F. Marcus,et al.  Pacemaker Failure Due to Radiation Therapy , 1982, Pacing and clinical electrophysiology : PACE.

[5]  D. Fleetwood,et al.  An overview of radiation effects on electronics in the space telecommunications environment , 2000 .

[6]  Ariel Lutenberg,et al.  Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference , 2012, IEEE Transactions on Nuclear Science.

[7]  Fabian Vargas,et al.  Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects , 2016, IEEE Transactions on Nuclear Science.

[8]  Ariel Lutenberg,et al.  A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation , 2012, J. Electron. Test..

[9]  J. L. Azarewicz,et al.  Radiation testing of semiconductor devices for space electronics , 1988, Proc. IEEE.

[10]  A. J. Terzuoli,et al.  Electromagnetic Interference and Ionizing Radiation Effects on CMOS Devices , 2012, IEEE Transactions on Plasma Science.

[11]  Ari Virtanen,et al.  Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions , 2016, IEEE Transactions on Nuclear Science.

[12]  P. Almond,et al.  The effects of cardiac pacemakers of ionizing radiation and electromagnetic interference from radiotherapy machines. , 1978, International journal of radiation oncology, biology, physics.

[13]  F. Fiori.  Integrated circuits immunity evaluation by different test procedures , 1999, 1999 International Conference on Computational Electromagnetics and its Applications. Proceedings (ICCEA'99) (IEEE Cat. No.99EX374).