Mechanical-plowing-based high-speed patterning on hard material via advanced-control and ultrasonic probe vibration.

In this paper, we present a high-speed direct pattern fabrication on hard materials (e.g., a tungsten-coated quartz substrate) via mechanical plowing. Compared to other probe-based nanolithography techniques based on chemical- and/or physical-reactions (e.g., the Dip-pen technique), mechanical plowing is meritorious for its low cost, ease of process control, and capability of working with a wide variety of materials beyond conductive and/or soft materials. However, direct patterning on hard material faces two daunting challenges. First, the patterning throughput is ultimately hindered by the "writing" (plowing) speed, which, in turn, is limited by the adverse effects that can be excited/induced during high-speed, and/or large-range plowing, including the vibrational dynamics of the actuation system (the piezoelectric actuator, the cantilever, and the mechanical fixture connecting the cantilever to the actuator), the dynamic cross-axis coupling between different axes of motion, and the hysteresis and the drift effects related to the piezoelectric actuators. Secondly, it is very challenging to directly pattern on ultra-hard materials via plowing. Even with a diamond probe, the line depth of the pattern via continuous plowing on ultra-hard materials such as tungsten, is still rather small (<0.5 nm), particularly when the "writing" speed becomes high. To overcome these two challenges, we propose to utilize a novel iterative learning control technique to achieve precision tracking of the desired pattern during high-speed, large-range plowing, and introduce ultrasonic vibration of the probe in the normal (vertical) direction during the plowing process to enable direct patterning on ultra hard materials. The proposed approach was implemented to directly fabricate patterns on a mask with tungsten coating and quartz substrate. The experimental results demonstrated that a large-size pattern of four grooves (20 μm in length with 300 nm spacing between lines) can be fabricated at a high speed of ~5 mm/s, with the line width and the line depth at ~95 nm and 2 nm, respectively. A fine pattern of the word "NANO" is also fabricated at the speed of ~5 mm/s.

[1]  Qingze Zou,et al.  Broadband measurement of rate-dependent viscoelasticity at nanoscale using scanning probe microscope: Poly(dimethylsiloxane) example , 2008 .

[2]  Heh-Nan Lin,et al.  Fabrication of metal nanowires by atomic force microscopy nanoscratching and lift-off process , 2005 .

[3]  A. Fleming,et al.  Evaluation of charge drives for scanning probe microscope positioning stages , 2008, 2008 American Control Conference.

[4]  Vittorio Foglietti,et al.  Atomic force microscopy lithography as a nanodevice development technique , 1999 .

[5]  T. Ando,et al.  High-speed Atomic Force Microscopy for Capturing Dynamic Behavior of Protein Molecules at Work , 2005 .

[6]  Xu,et al.  "Dip-Pen" nanolithography , 1999, Science.

[7]  Qingze Zou,et al.  A control approach to high-speed probe-based nanofabrication , 2009, 2009 American Control Conference.

[8]  Matthias M. Müller,et al.  Controlled structuring of mica surfaces with the tip of an atomic force microscope by mechanically induced local etching , 2004 .

[9]  Qingze Zou,et al.  A Modeling-Free Inversion-Based Iterative Feedforward Control for Precision Output Tracking of Linear Time-Invariant Systems , 2013, IEEE/ASME Transactions on Mechatronics.

[10]  Johan Snauwaert,et al.  Visualization of gold clusters deposited on a dithiol self-assembled monolayer by tapping mode atomic force microscopy , 2004 .

[11]  Qingze Zou,et al.  Iterative control of dynamics-coupling-caused errors in piezoscanners during high-speed AFM operation , 2005, IEEE Transactions on Control Systems Technology.

[12]  E. Stoll,et al.  Correction of geometrical distortions in scanning tunneling and atomic force microscopes caused by piezo hysteresis and nonlinear feedback , 1994 .

[13]  Gap-Yong Kim,et al.  Dynamics Compensation and Rapid Resonance Identification in Ultrasonic-Vibration-Assisted Microforming System Using Magnetostrictive Actuator , 2011, IEEE/ASME Transactions on Mechatronics.

[14]  Qingze Zou,et al.  Iterative Control Approach to Compensate for Both the Hysteresis and the Dynamics Effects of Piezo Actuators , 2007, IEEE Transactions on Control Systems Technology.

[15]  Li Zhang,et al.  High-rate tunable ultrasonic force regulated nanomachining lithography with an atomic force microscope , 2012, Nanotechnology.

[16]  Thomas W. Kenny,et al.  Ultrahigh-density atomic force microscopy data storage with erase capability , 1999 .

[17]  Andrew J. Fleming Techniques and considerations for driving piezoelectric actuators at high speed , 2008, SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring.

[18]  Martin Holland,et al.  Semiconductor quantum point contact fabricated by lithography with an atomic force microscope , 1997 .

[19]  Yang Li,et al.  Model-free iterative control of repetitive dynamics for high-speed scanning in atomic force microscopy. , 2009, The Review of scientific instruments.

[20]  Christophe Vieu,et al.  Electron beam lithography: resolution limits and applications , 2000 .

[21]  Takashi Okada,et al.  High-speed, sub-15 nm feature size thermochemical nanolithography. , 2007, Nano letters.

[22]  K. Yano,et al.  Stable bit formation in polyimide Langmuir–Blodgett film using an atomic force microscope , 2002 .