Free ion yield of trimethyl bismuth used as sensitive medium for high-energy photon detection
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J. Dognon | P. Verrecchia | J. Bard | J. Mols | D. Yvon | V. Dauvois | G. Tauzin | Viatcheslav Sharyy | M. Farradèche | X. Mancardi
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J. Dognon | P. Verrecchia | J. Bard | J. Mols | D. Yvon | V. Dauvois | G. Tauzin | Viatcheslav Sharyy | M. Farradèche | X. Mancardi