Machine Learning and Pattern Recognition Techniques for Information Extraction to Improve Production Control and Design Decisions

In today’s highly competitive global market, winning requires near-perfect quality. Although most mature organizations operate their processes at very low defects per million opportunities, customers expect completely defect-free products. Therefore, the prompt detection of rare quality events has become an issue of paramount importance and an opportunity for manufacturing companies to move quality standards forward. This paper presents the learning process and pattern recognition strategy for a knowledge-based intelligent supervisory system; in which the main goal is the detection of rare quality events through binary classification. The proposed strategy is validated using data derived from an automotive manufacturing systems. The \(l_1\)-regularized logistic regression is used as the learning algorithm for the classification task and to select the features that contain the most relevant information about the quality of the process. According to experimental results, 100% of defects can be detected effectively.

[1]  Tae-Hyung Kim,et al.  Feature selection for manufacturing process monitoring using cross-validation , 2013 .

[2]  Tom Fawcett,et al.  An introduction to ROC analysis , 2006, Pattern Recognit. Lett..

[3]  R. Tibshirani Regression Shrinkage and Selection via the Lasso , 1996 .

[4]  Fei Wang,et al.  Feature selection using feature ranking, correlation analysis and chaotic binary particle swarm optimization , 2014, 2014 IEEE 5th International Conference on Software Engineering and Service Science.

[5]  Raghunathan Rengaswamy,et al.  A review of process fault detection and diagnosis: Part III: Process history based methods , 2003, Comput. Chem. Eng..

[6]  Trevor Hastie,et al.  The Elements of Statistical Learning , 2001 .

[7]  Sergios Theodoridis,et al.  Pattern Recognition and Neural Networks , 2001, Machine Learning and Its Applications.

[8]  James D. Malley,et al.  Predictor correlation impacts machine learning algorithms: implications for genomic studies , 2009, Bioinform..

[9]  Hiroshi Motoda,et al.  Feature Extraction, Construction and Selection: A Data Mining Perspective , 1998 .

[10]  Marko Robnik-Sikonja,et al.  Theoretical and Empirical Analysis of ReliefF and RReliefF , 2003, Machine Learning.

[11]  Huan Liu,et al.  Feature Selection for High-Dimensional Data: A Fast Correlation-Based Filter Solution , 2003, ICML.

[12]  Huijun Gao,et al.  Data-Based Techniques Focused on Modern Industry: An Overview , 2015, IEEE Transactions on Industrial Electronics.

[13]  Michael I. Jordan,et al.  Feature selection for high-dimensional genomic microarray data , 2001, ICML.

[14]  Richard D. Braatz,et al.  Fault Detection and Diagnosis in Industrial Systems , 2001 .

[15]  Christine W. Chan,et al.  Artificial intelligence for monitoring and supervisory control of process systems , 2007, Eng. Appl. Artif. Intell..

[16]  Christopher M. Bishop,et al.  Neural networks for pattern recognition , 1995 .

[17]  Carlos A. Escobar,et al.  Big Data-Driven Manufacturing—Process-Monitoring-for-Quality Philosophy , 2017 .

[18]  Jay L. Devore,et al.  Probability and statistics for engineering and the sciences , 1982 .

[19]  Larry A. Rendell,et al.  The Feature Selection Problem: Traditional Methods and a New Algorithm , 1992, AAAI.

[20]  Mark A. Hall,et al.  Correlation-based Feature Selection for Discrete and Numeric Class Machine Learning , 1999, ICML.

[21]  A. Ng Feature selection, L1 vs. L2 regularization, and rotational invariance , 2004, Twenty-first international conference on Machine learning - ICML '04.

[22]  Wei Wang,et al.  Application of Global Optimization Methods for Feature Selection and Machine Learning , 2013 .

[23]  Okyay Kaynak,et al.  Big Data for Modern Industry: Challenges and Trends [Point of View] , 2015, Proc. IEEE.

[24]  Honglak Lee,et al.  Efficient L1 Regularized Logistic Regression , 2006, AAAI.

[25]  Andrew Y. Ng,et al.  On Feature Selection: Learning with Exponentially Many Irrelevant Features as Training Examples , 1998, ICML.

[26]  M. Peruggia Model Selection and Multimodel Inference: A Practical Information-Theoretic Approach (2nd ed.) , 2003 .