Temperature dependence on current-voltage characteristics of Ni∕Au–Al0.45Ga0.55N Schottky photodiode

Temperature dependence on electrical characteristics of a Ni∕Au–Al0.45Ga0.55N Schottky photodiode is investigated in a temperature range of 198–323K. The ideality factor decreases from 2.57 to 1.75, while the barrier height increases from 0.75to1.14eV in this temperature range. The ln(I)-V curves at a small forward current are intersectant at 273, 298, and 323K and are almost parallel at 198, 223, and 248K. This crossing of the ln(I)-V curves is an inherent property of Schottky diodes, and the almost parallel curves can be well explained by thermionic field emission theory.

[1]  E. H. Rhoderick,et al.  Metal–Semiconductor Contacts , 1979 .

[2]  J. Sullivan,et al.  Electron transport of inhomogeneous Schottky barriers: A numerical study , 1991 .

[3]  Theeradetch Detchprohm,et al.  Schottky barrier on n‐type GaN grown by hydride vapor phase epitaxy , 1993 .

[4]  Subhash Chand,et al.  On the existence of a distribution of barrier heights in Pd2Si/Si Schottky diodes , 1996 .

[5]  Shuji Nakamura,et al.  InGaN multi‐quantum‐well structure laser diodes grown on MgAl2O4 substrates , 1996 .

[6]  Manijeh Razeghi,et al.  AlxGa1−xN (0⩽x⩽1) ultraviolet photodetectors grown on sapphire by metal-organic chemical-vapor deposition , 1997 .

[7]  Joan M. Redwing,et al.  The role of the tunneling component in the current–voltage characteristics of metal-GaN Schottky diodes , 1998 .

[8]  Jinn-Kong Sheu,et al.  Effects of thermal annealing on the indium tin oxide Schottky contacts of n-GaN , 1998 .

[9]  Manijeh Razeghi,et al.  Solar-blind AlGaN photodiodes with very low cutoff wavelength , 2000 .

[10]  Manijeh Razeghi,et al.  Future of AlxGa1-xN materials and device technology for ultraviolet photodetectors , 2002, SPIE OPTO.

[11]  W. Lan,et al.  Inductively Coupled Plasma Reactive Ion Etching-Induced GaN Defect Studied by Schottky Current Transport Analysis , 2004 .

[12]  Hamza Abid,et al.  Electrical characterization of Au/n-GaN Schottky diodes , 2004 .

[13]  S. Chand On the intersecting behaviour of current–voltage characteristics of inhomogeneous Schottky diodes at low temperatures , 2004 .

[14]  Y. Lin Application of the thermionic field emission model in the study of a Schottky barrier of Ni on p-GaN from current–voltage measurements , 2005 .

[15]  I. Dökme,et al.  On the intersecting behaviour of experimental forward bias current–voltage (I–V) characteristics of Al/SiO2/p-Si (MIS) Schottky diodes at low temperatures , 2006 .