Evaluation of Interfacial Fracture Strength in Micro-Scale Components Combined with High-Voltage Environmental Electron Microscopy
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N. Tanaka | Yoshimasa Takahashi | S. Muto | Yuta Yamamoto | S. Arai | Kimitaka Higuchi | Hikaru Kondo | Y. Kitagawa | N. Tanaka | Y. Takahashi | S. Arai | H. Kondo | Y. Yamamoto | K. Higuchi | S. Muto