Can concurrent checkers help BIST?

Concurrent checkers are commonly used in computer systems to detect computational errors on-line, which enhances reliability. Using the coding theory framework developed earlier by the authors, concurrent checkers already available within the circuit are shown to be significant help to off-line testing. Specifically, test time can be reduced while improving the fault escape probability. The proposed combined scheme can be implemented with simple modification of existing hardware. Specifically proposed is a novel, dual use of concurrent checkers and BIST hardware, yielding mutual advantage.

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