The statistics of aging models and practical reality

The consequences of the inherent high variability of life data are described, and some objective methods to aid in the design and analysis of aging experiments are reviewed. It is argued that before accelerated aging tests and proposed aging models can acquire credibility with high-voltage (HV) equipment designers, testing of many more specimens and improved analysis methods are needed. The recent availability of sophisticated computer programs will aid in the analysis of aging data. >

[1]  M. Shaw,et al.  Water Treeing in Solid Dielectrics , 1984, IEEE Transactions on Electrical Insulation.

[2]  W. Meeker,et al.  Accuracy of approx confidence bounds using censored Weibull regression data from accelerated life tests , 1990 .

[3]  L. Simoni,et al.  A General Approach to the Endurance of Electrical Insulation under Temperature and Voltage , 1981, IEEE Transactions on Electrical Insulation.

[4]  R. E. Thomas,et al.  Procedure for developing experimental designs for accelerated tests for service-life prediction. [for solar cell modules] , 1978 .

[5]  W. T. Starr,et al.  Progressive Stress-A New Accelerated Approach to Voltage Endurance , 1961, Transactions of the American Institute of Electrical Engineers. Part III: Power Apparatus and Systems.

[6]  L. Dissado,et al.  Weibull Statistics in Dielectric Breakdown; Theoretical Basis, Applications and Implications , 1984, IEEE Transactions on Electrical Insulation.

[7]  Z. A. Lomnicki.  Methods for Statistical Analysis of Reliability and Life Data , 1976 .

[8]  G. Stone,et al.  The Statistical Analysis of a High Voltage Endurance Test on an Epoxy , 1979, IEEE Transactions on Electrical Insulation.

[9]  Greg C. Stone,et al.  A thermal cycling type test for generator stator winding insulation , 1991 .

[10]  T. W. Dakin,et al.  The voltage endurance of cast epoxy resins , 1978, 1978 IEEE International Conference on Electrical Insulation.

[11]  G. Stone,et al.  The Application of Weibull Statistics to Insulation Aging Tests , 1979, IEEE Transactions on Electrical Insulation.

[12]  J. R. Laghari,et al.  Lifetimes of polypropylene films under combined high electric fields and thermal stresses , 1989 .

[13]  P. Rustan,et al.  High voltages in space: innovation in space insulation , 1993 .

[14]  J. R. Laghari,et al.  Complex electrical thermal and radiation aging of dielectric films , 1993 .

[15]  G. C. Stone,et al.  Application of statistical methods to the design of solid insulation systems , 1985, Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1985.

[16]  N. Draper,et al.  Applied Regression Analysis , 1966 .

[17]  Thomas W. Dakin,et al.  Electrical Insulation Deterioration Treated as a Chemical Rate Phenomenon , 1948, Transactions of the American Institute of Electrical Engineers.

[18]  Akemi Futakawa,et al.  Mechanical Fatigue Characteristics of High Voltage Generator Insulation , 1978, IEEE Transactions on Electrical Insulation.

[19]  R. Bartnikas,et al.  Electrical aging and electroluminescence in epoxy under repetitive voltage surges , 1992 .

[20]  Jerald F. Lawless,et al.  Statistical Models and Methods for Lifetime Data. , 1983 .

[21]  Gian Carlo Montanari,et al.  Optimum design of life tests for insulating materials, systems and components , 1991 .