Characterizing leakage current in silicon nanowire-based field-effect transistors by applying pseudo-random sequences
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T. Roinila | M. Vilkko | Anran Gao | Tie Li | J. Verho | Yuelin Wang | Yuelin Wang | J. Verho | J. Lekkala | Tie Li | P. Kallio | Xiao Yu | T. Roinila | A. Gao | M. Vilkko | Xiao Yu | P. Kallio | J. Lekkala
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