Nanoscale imaging using a compact laser plasma EUV source

High resolution imaging methods and techniques are currently under development. One of them is an extreme ultraviolet (EUV) microscopy, based on Fresnel zone plates. In this paper a compact, high-repetition, laser-plasma EUV source, emitting quasi-monochromatic radiation at 13.8nm wavelength was used in a desktop EUV transmission microscopy with a spatial (half-pitch) resolution of 50nm. EUV microscopy images of objects with various thicknesses and the spatial resolution measurements using the knife-edge test are presented.