Metrological characterization of 3D imaging systems: progress report on standards developments

A significant issue for companies or organizations integrating non-contact three-dimensional (3D) imaging systems into their production pipeline is deciding in which technology to invest. Quality non-contact 3D imaging systems typically involve a significant investment when considering the cost of equipment, training, software, and maintenance contracts over the functional lifetime of a given system or systems notwithstanding the requirements of the global nature of manufacturing activities. Numerous methods have been published to “help” users navigate the many products and specifications claims about “quality”. Moreover, the “best” system for one application may not be ideally suited for another application. The lack of publically-available characterization methods from trusted sources for certain areas of 3D imaging make it difficult for a typical user to select a system based on information written on a specification sheet alone. An internationally-recognized standard is a vehicle that allows better communication between users and manufacturers. It is in this context that we present a progress report on standards developments to date in the diverse, but finite, world of non-contact 3D imaging systems from the nanometre to the 100 m range.

[1]  Richard K. Leach,et al.  Applications of super-resolution imaging in the field of surface topography measurement , 2013 .

[2]  J.-Angelo Beraldin,et al.  GD&T-Based Characterization of Short-Range Non-contact 3D Imaging Systems , 2013, International Journal of Computer Vision.

[3]  Lindsay W. MacDonald,et al.  Artefacts for optical surface measurement , 2011, Optical Metrology.

[4]  Alan M. Lytle,et al.  ASTM E57 3D imaging systems committee: an update , 2008, SPIE Defense + Commercial Sensing.

[5]  Jan Boehm,et al.  Close-Range Photogrammetry and 3D Imaging , 2013 .

[6]  Peter J. de Groot,et al.  Lateral resolution and instrument transfer function as criteria for selecting surface metrology instruments , 2012 .

[7]  Richard K. Leach,et al.  TOPICAL REVIEW: Bandwidth characteristics and comparisons of surface texture measuring instruments , 2010 .

[8]  Ulrich Neuschaefer-Rube,et al.  Artefacts with rough surfaces for verification of optical microsensors , 2007, SPIE Optical Metrology.

[9]  Michael McCarthy,et al.  Standards for testing freeform measurement capability of optical and tactile coordinate measuring machines , 2012 .

[10]  Simone Carmignato,et al.  Experimental study on performance verification tests for coordinate measuring systems with optical distance sensors , 2009, Electronic Imaging.

[11]  Richard K. Leach.  Some issues of traceability in the field of surface topography measurement , 2004 .

[12]  T. Owerko,et al.  Examining coherence of accuracy tests of total station surveying and geodetic instruments based on comparison of results of complete test procedures according to ISO 17123 , 2009 .

[13]  Reto Züst,et al.  Minimizing technical and financial risk when integrating and applying optical sensors for in-process measurement , 2004 .

[14]  Yonghuai Liu,et al.  3D Imaging, Analysis and Applications , 2012, Springer London.

[15]  Thomas Luhmann,et al.  RECOMMENDATIONS FOR AN ACCEPTANCE AND VERIFICATION TEST OF OPTICAL 3-D MEASUREMENT SYSTEMS , 2000 .

[16]  Alessandro Capra,et al.  Evaluating Dense 3D Surface Reconstruction Techniques using a Metrological Approach , 2015 .

[17]  A. Davies,et al.  Characterization of instrument drift using a spherical artifact , 2014 .

[18]  David J. Whitehouse,et al.  Technological shifts in surface metrology , 2012 .

[19]  F. AubinAustin.  A World Wide Assessment of Rapid Prototyping Technologies , 1994 .

[20]  G S Lane,et al.  The application of stereographic techniques to the scanning electron microscope , 1969 .

[21]  Enrico Savio,et al.  Metrology of freeform shaped parts , 2007 .

[22]  F. Bethmann,et al.  COMPARISON AND VERIFICATION OF OPTICAL 3-D SURFACE MEASUREMENT SYSTEMS , 2008 .

[23]  Reinhard Gottwald.  Field Procedures for Testing Terrestrial Laser Scanners (TLS) A Contribution to a Future ISO Standard , 2008 .

[24]  Richard Leach,et al.  Open questions in surface topography measurement: a roadmap , 2015 .

[25]  Paolo Minetola,et al.  Proposal of an innovative benchmark for comparison of the performance of contactless digitizers , 2010 .

[26]  M. Bordegoni,et al.  Resolution characteritazion of 3D cameras , 2009, Electronic Imaging.

[27]  D. Chetwynd.  Metrology and properties of engineering surfaces , 1990 .

[28]  Alessandro Voltan.  Metrological performance verification of optical Coordinate Measuring Systems , 2010 .

[29]  Francois Blais,et al.  Lateral resolution challenges for triangulation-based three-dimensional imaging systems , 2012 .

[30]  Thorsten Dziomba,et al.  NEW DEVELOPMENTS OF MEASUREMENT STANDARDS AND PROCEDURES FOR MICRO AND NANOMETROLOGY AT THE PTB , 2013 .

[31]  Luc Cournoyer,et al.  Characterization of Triangulation-Based 3D Imaging Systems Using Certified Artifacts , 2012 .

[32]  R. Leach.  Optical measurement of surface topography , 2011 .