论文信息 - $V_{t}$ Retention Distribution Tail in a Multitime-Program MLC SONOS Memory Due to a Random-Program-Charge-Induced Current-Path Percolation Effect - 字舞流文

$V_{t}$ Retention Distribution Tail in a Multitime-Program MLC SONOS Memory Due to a Random-Program-Charge-Induced Current-Path Percolation Effect

M. Y. Lee | Chih-Yuan Lu | Tahui Wang | Kuang-Chao Chen | J. Chiu | Chi-Wei Li | Y. Chou | Y. Chung | Tzu-I Huang