Novel theoretical analyses of some features of X-ray spectrometry—I: Tertiary effects in XRF analysis
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[1] R. Grieken,et al. Bremsstrahlung background in electron probe X-ray microanalysis of thin films , 1985 .
[2] J. Small,et al. An analytical algorithm for calculation of spectral distributions of x‐ray tubes for quantitative x‐ray fluorescence analysis , 1985 .
[3] R. Grieken,et al. Composition dependence of bremsstrahlung background in electron-probe x-ray microanalysis , 1984 .
[4] A. Markowicz. Theoretical evalution of the efficiency of compton scattered radiation method in EDXRF analysis , 1984 .
[5] Richard M. Rousseau,et al. Fundamental algorithm between concentration and intensity in XRF analysis 1—theory , 1984 .
[6] N. Broll,et al. Spectral intensity distributions from x‐ray tubes. Calculated versus experimental evaluations , 1984 .
[7] J. Riveros,et al. A modification of Kramers' law for the x-ray continuum from thick targets , 1984 .
[8] A. Kuczumow. The concentration correction equations as a consequence of the shiraiwa and fujino equation , 1982 .
[9] D. G. Smith,et al. The calculation of background in wavelength-dispersive electron microprobe analysis , 1981 .
[10] B. Hołyńska,et al. Empirical method of matrix effect elimination for samples of `intermediate' thickness in EDXRF analysis , 1979 .
[11] R. Gardner,et al. Fundamental parameters solution of the x-ray fluorescence analysis of nickel-iron-chromium alloys including tertiary corrections , 1976 .
[12] H. Meier,et al. On the application of radioisotope X-ray fluorescence analysis for the solution of environmental and industrial problems , 1976 .
[13] R. Gardner,et al. Monte Carlo simulation of the X‐ray fluorescence excited by discrete energy photons in homogeneous samples including tertiary inter‐element effects , 1975 .
[14] N. Fujino,et al. Theoretical correction procedures for X‐ray fluorescence analysis , 1974 .
[15] D. Taylor,et al. Quantitative Evaluation of Degree of Internal Standardization in X-ray Fluorescence Analysis Using Scattered X-rays , 1973 .
[16] G. Andermann,et al. Evaluation of an isolated atom model in the use of scattered radiation for internal standardization in x-ray fluorescence analysis , 1971 .
[17] Nobukatsu Fujino,et al. Theoretical Calculation of Fluorescent X-Ray Intensities of Nickel-Iron-Chromium Ternary Alloys , 1967 .
[18] Nobukatsu Fujino,et al. Theoretical Calculation of Fluorescent X-Ray Intensities in Fluorescent X-Ray Spectrochemical Analysis. , 1966 .
[19] Z. Kalman,et al. Theoretical study of X-ray fluorescent determination of traces of heavy elements in a light matrix. Application to rocks and soils. , 1962 .
[20] G. Andermann,et al. SCATTERED X-RAYS AS INTERNAL STANDARDS IN X-RAY EMISSION SPECTROSCOPY , 1958 .
[21] E. Gillam,et al. Some problems in the analysis of steels by X-ray fluorescence , 1952 .
[22] A. Kuczumow. Some possibilities for the use of so‐called ‘differential’ correction equations in x‐ray fluorescence analysis , 1984 .
[23] A. Markowicz. A method of correction for absorption matrix effects in samples of ‘intermediate’ thickness in EDXRF analysis , 1979 .
[24] W. L. Dunn,et al. A mathematical model for tertiary X‐rays from heterogeneous samples , 1975 .
[25] R. Rousseau,et al. Theoritical alpha coefficients for the Claisse-Quintin relation for X-ray spectrochemical analysis , 1974 .
[26] J. Sherman. Simplification of a formula in the correlation of fluorescent X-ray intensities from mixtures* , 1959 .
[27] Jacob Sherman,et al. The theoretical derivation of fluorescent X-ray intensities from mixtures , 1955 .