Defect Propagation from 3C-SiC Intermediate Layers to III–Nitride Epilayers
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T. Egawa | H. Fujimori | A. Watanabe | H. Nakanishi | Y. Abe | J. Komiyama | Shunichi Suzuki | N. Ohmori
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T. Egawa | H. Fujimori | A. Watanabe | H. Nakanishi | Y. Abe | J. Komiyama | Shunichi Suzuki | N. Ohmori