Fully differential charge-pump comparator-based pipelined ADC in 90 nm CMOS

In this paper, a fully differential charge-pump comparator-based pipelined analog-to-digital converter (ADC) is presented. The fully differential capacitive gain doubler is used in the first stage as multiplying digital-to-analog converter (MDAC). Since the first stage cannot drive large capacitive loads, therefore a topology with high input impedance is chosen for the second, third and following stages. This topology does not require the common-mode feedback (CMFB) circuit. Besides, it employs the cascode current source to minimize the overshoot at the output of stages. The proposed ADC has been designed and simulated in a 90nm CMOS technology. Simulation results show that the ADC achieves SNDR of 55.6dB and SFDR of 64.5dB at sampling frequency of 100MS/s and consumes 2.8mW from a 1V power supply.

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