Development and performance of a fast fibre-plate coupled CCD camera at medium energy and image processing system for electron holography
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K. Herrmann | K.-H. Herrmann | L. Liu | I. Daberkow | W. D. Rau | H. Tietz | I. Daberkow | H. Tietz | L. Liu | W. Rau
[1] Thomas L. Lentz,et al. Advances in Optical and Electron Microscopy , 1970, The Yale Journal of Biology and Medicine.
[2] F. Zemlin,et al. Coma-free alignment of high-resolution electron microscopes with the aid of optical diffractograms , 1978 .
[3] Jian-Min Zuo,et al. Large dynamic range, parallel detection system for electron diffraction and imaging , 1988 .
[4] L. Reimer,et al. Scanning Electron Microscopy , 1984 .
[5] O. Krivanek,et al. Three-fold astigmatism in high-resolution transmission electron microscopy , 1994 .
[6] A. Koster,et al. Practical autoalignment of transmission electron microscopes , 1992 .
[7] O. Krivanek. A method for determining the coefficient of spherical aberration from a single electron micrograph , 1976 .
[8] R A Schowengerdt,et al. Modulation-transfer-function analysis for sampled image systems. , 1984, Applied optics.
[9] Reiner Hegerl,et al. Towards automatic electron tomography , 1992 .
[10] Kazuo Ishizuka,et al. Coma-free alignment of a high-resolution electron microscope with three-fold astigmatism , 1994 .
[11] Joachim Mayer,et al. Quantitative characterization of point spread function and detection quantum efficiency for a YAG scintillator slow scan CCD camera , 1995 .
[12] K. Dierksen,et al. Determination of Image Aberrations in High-resolution Electron Microscopy using Diffractogram and Cross-correlation Methods , 1995 .
[13] Orchowski,et al. Electron holography surmounts resolution limit of electron microscopy. , 1995, Physical review letters.
[14] D. Krahl,et al. Performance of a low-noise CCD camera adapted to a transmission electron microscope , 1992 .
[15] K. Herrmann,et al. Performance of electron image converters with YAG single-crystal screen and CCD sensor , 1991 .
[16] P. Mooney,et al. Applications of slow-scan CCD cameras in transmission electron microscopy , 1993 .
[17] W. Ruijter,et al. Methods to measure properties of slow‐scan CCD cameras for electron detection , 1992 .