Amplifier and Transistor Noise‐Parameter Measurements

Methods for measuring the noise parameters of amplifiers and on-wafer transistors are reviewed. After some preliminary background information and conventions are presented, noise parameters are defined and the most common measurement strategies are presented, both for packaged amplifiers and for on-wafer transistors (or amplifiers). The uncertainty analysis for such measurements is reviewed, and check and verification methods are presented. Keywords: amplifier noise; noise figure; noise parameters; noise-parameter uncertainty analysis; transistor noise; uncertainty analysis; verification methods

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