A model of the high count rate performance of NaI(Tl)-based PET detectors

A detailed model of the response of large-area NaI(Tl) detectors used in PET and their triggering and data acquisition electronics has been developed. This allows the authors to examine the limitations of the imaging system's performance due to degradation in the detector performance from light pile-up and deadtime from triggering and event processing. Comparisons of simulation results to measurements from the HEAD PENN-PET scanner have been performed to validate the Monte Carlo model. The model was then used to predict improvements in the high count rate performance of the HEAD PENN-PET scanner using different signal integration times, light response functions, and detectors.

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