论文信息 - Improved interferometric method to measure near-carrier AM and PM noise

Improved interferometric method to measure near-carrier AM and PM noise

An improved version of the interferometric method to measure near-carrier AM and PM noise is being presented. The main feature of this scheme is the capability to reduce the instrument noise by correlating the output of two equal interferometers built around the same device to be tested, thus enhancing the sensitivity. Two double interferometers are described, operating in the microwave and VHF bands. The latter shows a noise floor of -194 dB rad/sup 2//Hz when the signal power is +8 dBm. The sensitivity of both the instruments turns out to be significantly higher than the ratio of the thermal noise divided by the carrier power.

Enrico Rubiola | Vincent Giordano | Jacques Groslambert

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