A two-dimensional numerical FET model for DC, AC, and large-signal analysis

A numerical model is presented allowing calculation of the dc, ac, and large-signal parameters of field-effect transistors (FET's). The numerical procedure is based on finite-difference approximations to the full time-dependent set of equations. The scheme presented uses centered difference quotients and an implicit treatment of the continuity equation. It is shown to be absolutely stable and accurate for time steps below 1 ps. A set of numerical data calculated for one typical example is compared systematically with experimental values. Excellent agreement between measured and computed values is found for the dc characteristics. Small-signal solutions, obtained by Fourier transform methods are also close to the empirical values. The good fit between experiment and numerical simulation is a thorough validation of both the physical model and the numerical procedure.

[1]  D. J. Bartelink,et al.  DIFFUSION OF ELECTRONS IN SILICON TRANSVERSE TO A HIGH ELECTRIC FIELD , 1970 .

[2]  S. Middelhoek Projection masking, thin photoresist layers and interference effects , 1970 .

[3]  Edward S. Yang,et al.  An analysis of current saturation mechanism of junction field-effect transistors , 1970 .

[4]  R. R. O'Brien,et al.  Two-dimensional analysis of j.f.e.t. structures containing a low-conductivity substrate , 1971 .

[5]  M. Reiser Difference methods for the solution of the time-dependent semiconductor flow equations , 1971 .

[6]  W. Shockley,et al.  A Unipolar "Field-Effect" Transistor , 1952, Proceedings of the IRE.

[7]  M. Reiser,et al.  Large-scale numerical simulation in semiconductor device modelling , 1972 .

[8]  S. M. Sze,et al.  Physics of semiconductor devices , 1969 .

[9]  Roger W. Hockney,et al.  A Fast Direct Solution of Poisson's Equation Using Fourier Analysis , 1965, JACM.

[10]  M. Reiser,et al.  Threshold voltages of normally off MESFET's , 1972 .

[11]  R. R. O'Brien,et al.  Computer aided two-dimensional analysis of the junction field-effect transistor , 1970 .

[12]  M. Reiser Two-dimensional analysis of substrate effects in junction f.e.t.s , 1970 .

[13]  J. Gillis,et al.  Matrix Iterative Analysis , 1961 .

[14]  W. Fawcett,et al.  Monte Carlo determination of electron transport properties in gallium arsenide , 1970 .

[15]  Wilhelm Niethammer,et al.  Iterationsverfahren und allgemeine Euler-Verfahren , 1967 .

[16]  H. Gummel A self-consistent iterative scheme for one-dimensional steady state transistor calculations , 1964 .

[17]  T. Sigmon,et al.  DIFFUSIVITY OF ELECTRONS AND HOLES IN SILICON , 1969 .

[18]  J. Slotboom Iterative scheme for 1- and 2- dimensional d.c.-transistor simulation , 1969 .

[19]  W. D. Ryan,et al.  Two-dimensional analysis of lateral-base transistors , 1971 .

[20]  P. Wolf,et al.  Microwave properties of Schottky-barrier field-effect transistors , 1970 .

[21]  Nguyen Huy Xuong,et al.  Mathematical 2-dimensional model of semiconductor devices , 1971 .

[22]  A. De Mari,et al.  An accurate numerical one-dimensional solution of the p-n junction under arbitrary transient conditions , 1967 .

[23]  S. Kataoka,et al.  Two-dimensional computer analysis of dielectric-surface-loaded GaAs bulk element , 1970 .

[24]  R. Hockney The potential calculation and some applications , 1970 .

[25]  P. Wolf,et al.  An improved microwave silicon MESFET , 1971 .

[26]  E. Wasserstrom,et al.  The potential due to a charged metallic strip on a semiconductor surface , 1970, Bell Syst. Tech. J..

[27]  J. A. Lewis The flat plate problem for a semiconductor , 1970 .

[28]  P. Dubock Erratum: Numerical analysis of forward and reverse bias potential distribution in a 2-dimensional p-n junction with applications to capacitance calculations , 1969 .

[29]  P. Dubock,et al.  D.C. numerical model for arbitrarily biased bipolar transistors in two dimensions , 1970 .

[30]  A. De Mari,et al.  An accurate numerical steady-state one-dimensional solution of the P-N junction , 1968 .