Backside laser testing of ICs for SET sensitivity evaluation
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Hervé Lapuyade | D. Lewis | Philippe Perdu | V. Pouget | Felix Beaudoin | Pascal Fouillat | Antoine Touboul | P. Perdu | V. Pouget | D. Lewis | P. Fouillat | F. Beaudoin | H. Lapuyade | A. Touboul
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