Analysis of surface roughness in Ti/Al/Ni/Au Ohmic contact to AlGaN/GaN high electron mobility transistors
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Baoshun Zhang | Min Yu | Zhihua Dong | Yong Cai | Cheng P. Wen | Shenghou Liu | Rumin Gong | Baoshun Zhang | C. Wen | Jinyan Wang | Yong Cai | Sheng-gen Liu | Jinyan Wang | Z. Dong | R. Gong | M. Yu
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