Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment.
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P. Alkemade | J. Frenken | W. Kessels | V. Vandalon | R. Felici | F. Carlá | W. Onderwaater | M. Jankowski | I. Groot | M. V. van Spronsen | R. Mom | S. Wenzel | L. Jacobse | M. Rost | Bert Crama | P. C. van der Tuijn | Matthijs van Weeren