论文信息 - Uncertainty in Reference Values for the Charpy V-notch Verification Program

Uncertainty in Reference Values for the Charpy V-notch Verification Program

We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO Guide to the Expression of Uncertainty in Measurement and models the between-machine bias using a Type B distribution. We demonstrate the method using actual data from the Charpy machine verification program.

Jolene D. Splett | Chih-Ming Wang | J. Splett | Chih-Ming Wang

[1] Christopher N. McCowan,et al. The NIST Charpy V-Notch Verification Program: Overview and Operating Procedures | NIST , 2003 .

[2] N. F. Zhang,et al. An Approach to Combining Results From Multiple Methods Motivated by the ISO GUM , 2000, Journal of research of the National Institute of Standards and Technology.