Statistical analysis of blind-oversampling CDR circuits

The paper deals with two statistical simulation models for feed-forward blind-oversampling Clock and Data Recovery circuits, which determine the center of the data eye by observing the positions of edges in a data stream. The first model describes the traditional averaged phase picking method based on counting the edges in several domains, which divide the signal period. The second model was developed for a newly proposed CDR circuit, which selects the optimum sampling phase upon the occurrence of several consecutive edges in one sampling domain. Its simulation model is based on the periodic Markov chain representation of the domain-selection process. The averaged Bit-Error Rate can be simply computed from the steady-state of the chain. The computational complexity of statistical models is determined by the added jitter properties rather than by the actual level of bit-error rate. The models include random jitter, sinusoidal jitter, and frequency offset of transmit and receive clocks.

[1]  Jing Yin,et al.  A Statistical Jitter Tolerance Estimation Applied for Clock and Data Recovery Using Oversampling , 2006, TENCON 2006 - 2006 IEEE Region 10 Conference.

[2]  Deog-Kyoon Jeong,et al.  Multi-gigabit-rate clock and data recovery based on blind oversampling , 2003, IEEE Commun. Mag..

[3]  Kwang-Hee Choi,et al.  A Single-Data-Bit Blind Oversampling Data-Recovery Circuit With an Add-Drop FIFO for USB2.0 High-Speed Interface , 2008, IEEE Transactions on Circuits and Systems II: Express Briefs.

[4]  Chih-Kong Ken Yang,et al.  A 0.5-/spl mu/m CMOS 4.0-Gbit/s serial link transceiver with data recovery using oversampling , 1998 .

[5]  M. Horowitz,et al.  A 0 . 5m CMOS 4 . 0-Gbit / s Serial Link Transceiver with Data Recovery Using Oversampling , 1998 .

[6]  N. Tzartzanis,et al.  A 40–44 Gb/s 3$\times$ Oversampling CMOS CDR/1:16 DEMUX , 2007, IEEE Journal of Solid-State Circuits.

[7]  Hirotaka Tamura,et al.  A 40-to-44Gb/s 3× Oversampling CMOS CDR/1:16 DEMUX , 2007, 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers.

[8]  Ming-ta Hsieh,et al.  Architectures for multi-gigabit wire-linked clock and data recovery , 2008, IEEE Circuits and Systems Magazine.

[9]  Zdeněk Kolka,et al.  Blind Oversampling Data Recovery with Low Hardware Complexity , 2010 .

[10]  Martin L. Schmatz,et al.  Jitter measurements of high-speed serial links , 2004, IEEE Design & Test of Computers.

[11]  Hirotaka Tamura,et al.  A 3.2 Gb/s CDR Using Semi-Blind Oversampling to Achieve High Jitter Tolerance , 2007, IEEE Journal of Solid-State Circuits.