FAULT DETECTION OF COMBINATIONAL CIRCUITS BASED ON SUPPLY CURRENT
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[1] H. Akaike. Statistical predictor identification , 1970 .
[2] T. Shiragasawa,et al. An On-Lined Laser Probing System for Diagnosing Scaled VLSI , 1985, ITC.
[3] H. Akaike. Power spectrum estimation through autoregressive model fitting , 1969 .
[4] Herb Boulton. New Concepts of Applying Thermographic Testing to Printed Circuit Boards and Finished Products , 1985, ITC.