Simultaneous Monitoring of Molecular Thin Film Morphology and Crystal Structure by X-ray Scattering
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D. Chi | P. Šiffalovič | E. Majková | O. Konovalov | F. Schreiber | M. Hulman | A. Chumakov | M. Jergel | A. Hinderhofer | M. Sojková | P. Nádaždy | J. Chai | Shijie Wang | N. Mrkyvkova | M. Hodas