Effect of electrical stresses on the susceptibility of a voltage regulator

Analog circuits such as linear voltage regulators are very sensitive to electromagnetic interferences which induce voltage offset on their outputs. In harsh environments, the aging of this component can be accelerated and could lead to an increase of the effect of electromagnetic interferences. This paper proposes an original study about the drift of the susceptibility level of a low dropout voltage regulator submitted to electrical stresses. Some analyses based on CAD simulations are proposed to explain the experimental observations.

[1]  B. Li,et al.  Prediction of Long-term Immunity of a Phase-Locked Loop , 2011, 2011 12th Latin American Test Workshop (LATW).

[2]  Franco Fiori.  A new nonlinear model of EMI-induced distortion phenomena in feedback CMOS operational amplifiers , 2002 .

[3]  S. Buso,et al.  Reducing the EMI Susceptibility of a Kuijk Bandgap , 2008, IEEE Transactions on Electromagnetic Compatibility.

[4]  Frederic Lafon,et al.  Influence of Aging and Environnement Conditions on EMC Performances of Electronic Equipment - Influence of Passive vs Active Components , 2010 .

[5]  Xiaojun Li,et al.  Electronic circuit reliability modeling , 2006, Microelectron. Reliab..

[6]  K. E. Kuijk,et al.  A precision reference voltage source , 1973 .

[7]  N. Berbel,et al.  Impact of NBTI on EMC behaviours of CMOS inverter , 2010, 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility.

[8]  Franco Fiori,et al.  Linear voltage regulator susceptibility to conducted EMI , 2002, Industrial Electronics, 2002. ISIE 2002. Proceedings of the 2002 IEEE International Symposium on.