Reliability of the Properties of (Pb,La)(Zr,Ti)O 3 Capacitors with Non–noble Metal Oxide Electrodes stored in an H 2 Atmosphere
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K. Kondo | T. Yoshimura | N. Fujimura | N. Okamoto | Yoko Takada | Takeyasu Saito | K. Higuchi | A. Kitajima | R. Shishido