论文信息 - Quantitative comparison of direct and derivative AES with XPS of metal sulfides - 字舞流文

Quantitative comparison of direct and derivative AES with XPS of metal sulfides

D. Griffis | R. W. Linton

[1] W. S. Woodward,et al. Primary electron beam current regulator for pulse-counting Auger electron spectroscopy , 1982 .

[2] R. Shimizu,et al. Backscattering correction for quantitative Auger analysis: I. Monte Carlo calculations of backscattering factors for standard materials , 1981 .

[3] W. S. Woodward,et al. Microcomputer approach to elemental depth profiling with Auger electron spectrometry , 1981 .

[4] R. W. Linton,et al. Chemical characterization of hydrous ferric oxides by x-ray photoelectron spectroscopy , 1981 .

[5] E. Sickafus. A secondary electron emission correction for quantitative Auger yield measurements , 1980 .

[6] M. Seah. Quantitative Auger electron spectroscopy: Via the energy spectrum or the differential? , 1979 .

[7] P. Hall,et al. Matrix effects in quantitative auger analysis of dilute alloys , 1979 .

[8] N. McIntyre,et al. Preferential sputtering in oxides as metals and revealed by x‐ray photoelectron spectroscopy , 1979 .

[9] W. A. Dench,et al. Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids , 1979 .

[10] T. Tsang,et al. XPS studies of ion-bombardment damage of transition metal sulfides , 1980 .

[11] A. W. Czanderna,et al. Methods of Surface Analysis , 1977 .

[12] P. Hall,et al. Relative sensitivity factors for quantitative Auger analysis of binary alloys , 1977 .