论文信息 - Flat Field Response Of The Microchannel Plate Detectors Used On The Extreme Ultraviolet Explorer

Flat Field Response Of The Microchannel Plate Detectors Used On The Extreme Ultraviolet Explorer

We present the results of the extreme ultraviolet (EUV) flat field calibrations of two of the flight detectors to be flown on the Extreme Ultraviolet Explorer Satellite (EUVE). Images of ~40 million detected events binned 512 by 512 are sufficient to show MCP fixed pattern noise such as hexagonal microchannel multifiber bundle interfaces, "dead" spots, edge distortion, and differential nonlinearity. Differences due to photocathode material and dependencies on EUV wavelength are also described. Over large spatial scales the detector response is flat to better than 10% of the mean response but at spatial scales less than 1 mm the variations from the mean can be as large as 20%.

John V. Vallerga | Oswald H. W. Siegmund | Peter William Vedder | J. L. Gibson

[1] J V Vallerga,et al. Soft x-ray and extreme ultraviolet quantum detection efficiency of potassium bromide photocathode layers on microchannel plates. , 1988, Applied optics.

[2] Stuart Bowyer,et al. The Extreme Ultraviolet Explorer Spectrometer: Performance Characteristics Based On Development Of The Collimator, Variable Line Space Gratings, Telescope And Detectors , 1986, Other Conferences.

[3] D. Werthimer,et al. Microchannel Plate EUV Detectors for the Extreme Ultraviolet Explorer , 1984, IEEE Transactions on Nuclear Science.

[4] Patrick Jelinsky,et al. The Berkeley Extreme Ultraviolet Calibration Facility , 1988, Optics & Photonics.

[5] Stuart Bowyer,et al. The Extreme Ultraviolet Explorer: Overview And Calibration , 1989, Optics & Photonics.

[6] John V. Vallerga,et al. Imaging characteristics of the Extreme Ultraviolet Explorer microchannel plate detectors , 1989 .