论文信息 - Reliability failure modes in interconnects for the 45 nm technology node and beyond - 字舞流文

Reliability failure modes in interconnects for the 45 nm technology node and beyond

E. Petitprez | E. Richard | Y. Le Friec | C. Besset | L. Arnaud | P. Waltz | S. Chhun | G. Imbert | M. Vilmay | L. Doyen | F. Terrier | D. Galpin | C. Monget | D. Roy