Reliability of compound semiconductor workshop historical review

This discussion is meant to look back at reliability progress over the last two decades and identify a few items that have been learned. While the Workshop addresses various specific Issues individually, It is the accumulation of a variety of data, information, and experience which forms the basis of an assessment of reliability. In the end, reliability is simply an insightful perception of facts and statistics. After 20 years of Workshop meetings, it is time to review, compare, and discuss the progress and the future of Compound Semiconductor Reliability.

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[2]  W.J. Roesch,et al.  Studying yield and reliability relationships for metal defects , 2004, JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004..

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[4]  William J. Roesch,et al.  Humidity resistance of GaAs ICs , 1994, Proceedings of 1994 IEEE GaAs IC Symposium.

[5]  B. Yeats,et al.  Assessing the reliability of silicon nitride capacitors in a GaAs IC process , 1998 .

[6]  Degradation mechanisms of GaAs PHEMTs in high humidity conditions , 2004 .

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[8]  D. Leung,et al.  Dielectric breakdown, defects and reliability in SiN MIMCAPs , 1998, 1998 GaAs Reliability Workshop. Proceedings (Cat. No.98EX219).

[9]  Charles S. Whitman,et al.  Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method , 2004 .

[10]  J. Alamo,et al.  A model for hydrogen-induced piezoelectric effect in InP HEMTs and GaAs PHEMTs , 2002 .

[11]  D. Ahlgren,et al.  Trends in silicon germanium BiCMOS integration and reliability , 2000, 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).

[12]  Xinxing Yang,et al.  Lifetime acceleration model for HAST tests of a pHEMT process , 2004, Proceedings GaAs Reliability Workshop, 2003..

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[14]  H. Cramer,et al.  MMIC capacitor dielectric reliability , 1998, 1998 GaAs Reliability Workshop. Proceedings (Cat. No.98EX219).

[15]  William J. Roesch,et al.  Lifetesting GaAs MMICs under RF stimulus , 1992, IEEE 1992 Microwave and Millimeter-Wave Monolithic Circuits Symposium Digest of Papers.