Review of multiple-stress models in accelerated life testing

When inference concerning the life length of high reliability items is required, accelerated life testing which is conducted in a more severe environment than occurs in actual use is used to save time and cost of testing.In order to make inference about the life length of the item operating under use conditions based on failure data obtained under the more severe environment,the key is to determine a multiple-stress model.This paper gives an outline on some representational multiple-stress models in the world.In particular,several electrical-insulator accelerated models under combined thermal and electrical stress are presented and their applicability is analyzed.These include models proposed by Fallou,et al.In addition,an accelerated model on simple PWB under temperature and vibration proposed by Barker is also discussed.Some areas that should be continued to develop are finally pointed out.