Synchrotron-Based X-Ray Fluorescence Microscopy as a Technique for Imaging of Elements in Plants1[OPEN]
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D. Paterson | E. Lombi | Peng Wang | P. Kopittke | T. Punshon | A. van der Ent | R. Tappero | A. Ent | F. Blamey | Peng Wang | Peng Wang