ABSTRACT We demonstrate the effectiveness of two techniques for using X‐rays to evaluate the amount of charge diffusion in charge‐coupled devices (CCDs). We quantify the degree of charge diffusion with two parameters: \documentclass{aastex} \usepackage{amsbsy} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{bm} \usepackage{mathrsfs} \usepackage{pifont} \usepackage{stmaryrd} \usepackage{textcomp} \usepackage{portland,xspace} \usepackage{amsmath,amsxtra} \usepackage[OT2,OT1]{fontenc} \newcommand\cyr{ \renewcommand\rmdefault{wncyr} \renewcommand\sfdefault{wncyss} \renewcommand\encodingdefault{OT2} \normalfont \selectfont} \DeclareTextFontCommand{\textcyr}{\cyr} \pagestyle{empty} \DeclareMathSizes{10}{9}{7}{6} \begin{document} \landscape $\sigma _{d}$ \end{document} , the standard deviation for a Gaussian diffusion model, and Q, a ratio of the point‐spread function (PSF) peak to its wings. The parameters \documentclass{aastex} \usepackage{amsbsy} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{b...
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