Defect study in ZnO related structures—A multi-spectroscopic approach
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H. C. Ong | A. Djurišić | W. Skorupa | Linghong Lu | G. Brauer | Jiaming Luo | Shijie Xu | W. Anwand | C. Cheung | C. Ling | C. Beling | Chunyan Zhu | S. Fung | Q. Gu | K. Tam | Xue-min Dai