论文信息 - Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films - 字舞流文

Ellipsometric and XPS analysis of the interface between silver and SiO2, TiO2 and SiNx thin films

E. Masetti | G. D. Santo | S. Gagliardi | V. Janicki | J. Bulíř | C. Coluzza | A. Krasilnikova