论文信息 - A new approach to the diagnostics of nanoislands in GexSi1 − x/Si heterostructures by secondary ion mass spectrometry - 字舞流文

A new approach to the diagnostics of nanoislands in GexSi1 − x/Si heterostructures by secondary ion mass spectrometry

D. N. Lobanov | M. Drozdov | P. Yunin | A. Novikov | Y. Drozdov | N. Zakharov | D. Yurasov