Reliability is an important consideration during semiconductor technology development, which ensures that the performances of devices, circuits, and systems are maintained over a specified period of time, leading to successful products. Device reliability is at the core of overall product reliability, which continues to remain an important area of research and has attracted the attention of IEEE Transactions on Electron Devices (T-ED) authors and readers throughout the years. Device reliability can be classified into two broad areas: gradual drift of device performance over time or sudden failure, and both are of importance for logic, memory, RF, and power devices. Different aspects of device reliability are usually reported, such as the development of electrical or physical characterization methods, investigation and modeling of a particular phenomenon, impact of material and processes on reliability, and development of reliability tolerant technologies.