论文信息 - Hot-carrier aging of the MOS transistor in the presence of spin-on glass as the interlevel dielectric

Hot-carrier aging of the MOS transistor in the presence of spin-on glass as the interlevel dielectric

The effect of introducing a polysilicate or polysiloxane spin-on glass (SOG) as a component of the interlevel dielectric in a multilevel integrated circuit on the hot-carrier aging of the MOS transistor is discussed. It was found that the presence of SOG led to accelerated aging of the MOS transistor: factors of 20 and 5 for silicate and siloxane, respectively. This effect is attributed to water absorbed in the SOG films. a correlation was found for the hot-carrier aging rate and the amount of absorbed water.<<ETX>>

G. Smolinsky | N. Lifshitz | G. Smolinsky | N. Lifshitz

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