Summary of “IAEA intercomparison of IBA software”

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[9]  N. Barradas Fitting of RBS data including roughness: Application to Co/Re multilayers , 2002 .

[10]  Milko Jakšić,et al.  The 2000 IAEA intercomparison of PIXE spectrum analysis software , 2002 .

[11]  H. Riesemeier,et al.  RBS, SY-XRF, INAA and ICP-IDMS of antimony implanted in silicon – A multi-method approach to characterize and certify a reference material , 2002 .

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