Summary of “IAEA intercomparison of IBA software”
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M. Bianconi | C. Jeynes | M. Thompson | N. Barradas | E. Szilágyi | M. Mayer | G. Battistig | K. Arstila | E. Rauhala | G. Lulli | E. Kótai | N. Dytlewski
[1] N. P. Barradas,et al. International Atomic Energy Agency intercomparison of ion beam analysis software , 2007 .
[2] J. Keinonen,et al. Multiple scattering of MeV ions: Comparison between the analytical theory and Monte-Carlo and molecular dynamics simulations , 2006 .
[3] N. P. Barradas,et al. Status of ion beam data analysis and simulation software , 2006 .
[4] E. Alves,et al. Beyond single scattering off flat samples , 2005 .
[5] N. Barradas. Double scattering in grazing angle Rutherford backscattering spectra , 2004 .
[6] M. Jenkin,et al. TOPICAL REVIEW: Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool , 2003 .
[7] Interne Stellenausschreibung. Max-Planck-Institut für Plasmaphysik , 2003 .
[8] M. Mayer. Ion beam analysis of rough thin films , 2002 .
[9] N. Barradas. Fitting of RBS data including roughness: Application to Co/Re multilayers , 2002 .
[10] Milko Jakšić,et al. The 2000 IAEA intercomparison of PIXE spectrum analysis software , 2002 .
[11] H. Riesemeier,et al. RBS, SY-XRF, INAA and ICP-IDMS of antimony implanted in silicon – A multi-method approach to characterize and certify a reference material , 2002 .
[12] S. Fazinić,et al. The 2000 IAEA test spectra for PIXE spectrometry , 2001 .
[13] Juhani Keinonen,et al. Monte Carlo simulation of multiple and plural scattering in elastic recoil detection , 2001 .
[14] G. G. Bentini,et al. Determination of He electronic energy loss in crystalline Si by Monte-Carlo simulation of Rutherford backscattering–channeling spectra , 2000 .
[15] E. Szilágyi. Energy spread in ion beam analysis , 2000 .
[16] T. Sajavaara,et al. Effects of surface roughness on results in elastic recoil detection measurements , 2000 .
[17] W. Eckstein,et al. Rutherford backscattering from layered structures beyond the single scattering model , 1999 .
[18] N. P. Barradas,et al. The RBS data furnace: Simulated annealing , 1998 .
[19] N. P. Barradas,et al. Simulated annealing analysis of Rutherford backscattering data , 1997 .
[20] E. Kótai. RBX, computer methods for analysis and simulation of RBS and ERDA spectra , 1997 .
[21] M. Bianconi,et al. Different methods for the determination of damage profiles in Si from RBS-channeling spectra: a comparison , 1996 .
[22] E. Szilágyi,et al. Theoretical approximations for depth resolution calculations in IBA methods , 1995 .
[23] N. Barradas,et al. Study of multilayer substrate surface roughness using RBS with improved depth resolution , 1994 .
[24] E. Kótai,et al. Computer methods for analysis and simulation of RBS and ERDA spectra , 1994 .
[25] J. Biersack,et al. The width of an RBS spectrum: influence of plural and multiple scattering , 1992 .
[26] Eero Rauhala,et al. Interactive personal-computer data analysis of ion backscattering spectra , 1992 .
[27] Q. Yang,et al. Empirical formulae for energy loss straggling of ions in matter , 1991 .
[28] J. Biersack,et al. The Stopping and Ranges of Ions in Solids , 1993 .
[29] L. Doolittle. A semiautomatic algorithm for rutherford backscattering analysis , 1986 .
[30] Lawrence R. Doolittle,et al. Algorithms for the rapid simulation of Rutherford backscattering spectra , 1985 .
[31] E. Rauhala. Computer analysis of ion elastic backscattering: An iterative fitting method , 1984 .
[32] Robin P. Gardner,et al. A generalized method for correcting pulse-height spectra for the peak pile-up effect due to double sum pulses. Part II. The inverse calculation for obtaining true from observed spectra , 1977 .
[33] W. Chu. Calculation of energy straggling for protons and helium ions , 1976 .
[34] Robin P. Gardner,et al. Prediction of the pulse-height spectral distortion caused by the peak pile-up effect , 1976 .
[35] F. Käppeler,et al. Ion beam surface layer analysis , 1976 .