A method for efficient Radiation Hardening of multicore processors

This paper describes a method for developing Radiation Hardened by Design (RHBD) multicore processor Integrated Circuits (ICs) that meet specific single-event error rate targets in space environments with minimal impacts on power, area, and speed.

[1]  Koustav Bhattacharya,et al.  Redundancy Mining for Soft Error Detection in Multicore Processors , 2011, IEEE Transactions on Computers.

[2]  J. Holmes,et al.  A Bias-Dependent Single-Event Compact Model Implemented Into BSIM4 and a 90 nm CMOS Process Design Kit , 2009, IEEE Transactions on Nuclear Science.

[3]  Stephen P. Crago,et al.  Software-based fault tolerance for the Maestro many-core processor , 2011, 2011 Aerospace Conference.

[4]  E. Normand,et al.  Heavy Ion, High-Energy, and Low-Energy Proton SEE Sensitivity of 90-nm RHBD SRAMs , 2010, IEEE Transactions on Nuclear Science.

[5]  Kevin Kranen.  Electronic design automation (EDA) flow for development of an ARM Processor-based silicon-on-insulator (SOI) SoC , 2009, 2009 IEEE International SOI Conference.

[6]  Mahmut T. Kandemir,et al.  Compiler-directed instruction duplication for soft error detection , 2005, Design, Automation and Test in Europe.

[7]  D. R. Ball,et al.  Total-ionizing-dose radiation response of 32 nm partially and 45 nm fully-depleted SOI devices , 2012, 2012 IEEE International SOI Conference (SOI).

[8]  Boris Murmann.  Digitally Assisted Analog Circuits , 2006, IEEE Micro.

[9]  D. Geer,et al.  Chip makers turn to multicore processors , 2005, Computer.

[10]  Carlos Villalpando,et al.  Reliable multicore processors for NASA space missions , 2011, 2011 Aerospace Conference.

[11]  Edward J. McCluskey,et al.  An Iterative Cell Switch Design for Hybrid Redundancy , 1973, IEEE Transactions on Computers.

[12]  Richard J. Doyle,et al.  Enabling Future Robotic Missions with Multicore Processors , 2011 .

[13]  R. Brees,et al.  Predicting the Single-Event Error Rate of a Radiation Hardened by Design Microprocessor , 2011, IEEE Transactions on Nuclear Science.

[14]  Ethan H. Cannon,et al.  At-Speed SEE Testing of RHBD Embedded SRAMs , 2013, IEEE Transactions on Nuclear Science.

[15]  P. Dodd,et al.  Radiation effects in SOI technologies , 2003 .

[16]  Ethan H. Cannon,et al.  Robust SEU Mitigation of 32 nm Dual Redundant Flip-Flops Through Interleaving and Sensitive Node-Pair Spacing , 2013, IEEE Transactions on Nuclear Science.

[17]  Ching-Te Chuang,et al.  Floating-body effects in partially depleted SOI CMOS circuits , 1997 .