A method of life testing is proposed which combines both ordinary and accelerated life-testing procedures. It is assumed that an item can be tested either in a standard environment or under stress. The amount of stress is fixed in advance and is the same for all items to be tested However, the time x at which an item on lest is taken out of the standard environment and put under stress can be chosen by the experimenter subject to a given cost structure. When an item is put under stress its lifetime is changed by the factor α. Let the random variable T denote the lifetime of an item in the standard environment, and let γ denote its lifetime under the partially accelerated test procedure just described. Then Y = T if T ≦ x, and Y = x + α (T > x) if T > x. It is assumed that T has an exponential distribution with parameter θ. The estimation of θ and α and the optimal design of a partially accelerated life test are studied in the framework of Bayesian decision theory.
[1]
Herman Chernoff,et al.
An Optimal Sequential Accelerated Life Test
,
1962
.
[2]
Thomas J. Kielpinski,et al.
Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
,
1975,
IEEE Transactions on Reliability.
[3]
William Q. Meeker,et al.
Optimum Accelerated Life-Tests for the Weibull and Extreme Value Distributions
,
1975,
IEEE Transactions on Reliability.
[4]
B. Epstein.
Estimation from Life Test Data
,
1960
.
[5]
P. Goel.
Consistency and asymptotic normality of maximum likelyhood estimators
,
1975
.
[6]
Herman Chernoff,et al.
Optimal Accelerated Life Designs for Estimation
,
1962
.