Electrical Characteristics of Large-Scale Integration Silicon MOSFET's at Very High Temperatures,Part III: Modeling and Circuit Behavior
暂无分享,去创建一个
Wei Hwang | F. Shoucair | F. Shoucair | W. Hwang | P. Jain | Prem Jain
[1] L. T. Fitch,et al. Performance of Digital Integrated Circuit Technologies at Very High Temperatures , 1980 .
[2] P. Gray,et al. Threshold-voltage temperature drift in ion-implanted MOS transistors , 1982 .
[3] N. Shiono,et al. Threshold-voltage instability of n-channel MOSFET's under bias-temperature aging , 1982, IEEE Transactions on Electron Devices.
[4] R. K. Jurgen. Automotive electronics: Drivers get more options in 1983: Car makers embrace electronics in an all-out drive to improve performance, handling, fuel economy, riding quality, driver aids, and entertainment , 1982, IEEE Spectrum.
[5] S. M. Sze,et al. Physics of semiconductor devices , 1969 .
[6] H. C. Card,et al. On the temperature dependence of subthreshold currents in MOS electron inversion layers , 1979 .
[7] Wei Hwang,et al. Electrical characteristics of large scale integration (LSI) MOSFETs at very high temperatures part I: Theory , 1984 .