Reliability studies of a 32nm System-on-Chip (SoC) platform technology with 2nd generation high-k/metal gate transistors
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M. Agostinelli | G. Curello | H. Deshpande | W. Hafez | K. Komeyli | J. Park | K. Phoa | A. Rahman | C. Tsai | J. Xu | J.-Y. Yeh | P. Bai | C. -H. Jan
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