论文信息 - Proposal for photothermal characterization of boundaries between layer and substrate

Proposal for photothermal characterization of boundaries between layer and substrate

The accurate measurement of frequency dependent photothermal phase angle curves allows the characterization of the boundary layer between substrate and coating. Regarding the measurable quantities phase extremum and the ratio of the abscissa for the zero crossing and the extremum we can classify the boundary type as a jump in material properties, as a delamination or as a diffusion zone between substrate and coating.

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